Perkin Elmer XRD 1640 AL3 ES 95510263 Flat Panel X-Ray Detector

Perkin Elmer XRD 1640 AL3 ES (MPN: 95510263) Digital X-Ray Detector System

The Perkin Elmer XRD 1640 AL3 ES (Part Number: 95510263) is a ruggedized, high-yield amorphous silicon (a-Si:H) flat-panel digital X-ray detector designed for demanding radiographic and non-destructive examination (NDE) environments. Built around a large-format 409.6 mm × 409.6 mm (approx. 16″ × 16″) active imaging matrix, this unit couples a direct-deposition columnar Cesium Iodide (CsI:Tl) scintillator directly onto a thin-film transistor (TFT) photodiode array.

Engineered for high quantum efficiency (DQE) across broad photon energy bands (30 keV to MV ranges), the AL3 ES variant features an “Extended Shielding” (ES) chassis engineered to mitigate stray radiation degradation to sensitive read-out electronics (ROGs) and gate drivers. For marine surveying, shipyard hull fabrication, off-shore pipeline weld inspection, and high-energy oncology simulation, this panel provides frame stability, high dynamic range (16-bit digitization), and rapid digital data acquisition via fiber-optic or dedicated high-speed copper interfaces.

Technical Specifications

Features

1. Large 41 × 41 cm Active Matrix: Provides full 1024 × 1024 pixel resolution at 400 µm pitch, capturing large-bore pipe welds, casting nodes, and structural assemblies in a single exposure.
2. Integrated Extended Shielding (ES Structure): Built with internal radiation absorption plates behind the readout electronics, maximizing system lifecycle and noise immunity in high-energy isotope or linear accelerator environments.
3. High Dynamic Range 16-Bit Digitization: Dual-gain integrating amplifiers convert signal charges up to 84 pC, yielding a 16-bit dynamic output that resolves dense metallurgical cross-sections and minute pore flaws simultaneously.
4. Fast Acquisition Frame Rate: Delivers up to 3.5 frames per second in non-binned mode and up to 7 fps in 2×2 binning mode for rapid inline radiographic scanning and dynamic automated inspection.
5. Engineered CsI:Tl Scintillator Layer: Columnar crystalline structure acts as an optical fiber bundle, reducing internal light scattering to maintain spatial resolution across high-energy exposure levels.

Compatibility

• Dedicated Power Supply Units (PSU):
  • PerkinElmer XRD-EP Power Supply Unit (P/N: 95510254)
  • PerkinElmer RID-LPX / XRD-LPX Low Power Supply (P/N: 95510255)
  • Associated DC interconnection harnesses: 95510321 (25 ft), 95510322 (50 ft), 95510323 (16.5 ft)
• Frame Grabbers & Acquisition Hardware:
  • PerkinElmer XRD Digital Frame Grabber (PCI / PCIe high-speed DMA interface boards)
  • Fiber-optic interface transceivers for long-distance console isolation
• Generator & Radiation Source Compatibility:
  • High-frequency industrial X-ray tubes: 160 kV, 225 kV, 320 kV, and 450 kV assemblies (Comet, Gulmay, Spellman)
  • Linear Accelerators (Linac) and radioisotope exposure devices

Part Number Cross-References

• Primary Manufacturer Part Number: 95510263
• Model Descriptor: XRD 1640 AL3 ES (Extended Shielding)
• Associated Family Part Numbers:
• 95510260 (XRD 1640 AL1 series)
• 95510262 (XRD 1640 AL2 / AG variants)
• 95510254 (XRD-EP Power Supply)
• 95510320 (XRD-EP DC Adapter Interface)

Applications

• Marine Hull & Structural Joint Radiography: Digital real-time evaluation of thick-plate submerged arc welded (SAW) butt joints on offshore rigs, pressure hulls, and FPSO mooring turrets.
• High-Pressure Shipboard Steam & Fuel Line Inspection: Corrosion Under Insulation (CUI) and flow-accelerated corrosion (FAC) profiling on heavy boiler lines without insulation removal.
• Foundry Castings & Precision Valves: Radiographic inspection of cast duplex stainless steel pump casings, ship propeller hub castings, and subsea blowout preventer (BOP) blocks.
• Radiotherapy Simulation & Portal Imaging (EPID): Megavoltage (MV) portal beam verification and dosimetry in clinical oncology gantries.
• 3D Computed Tomography (CT): Industrial CT reconstruction for turbine blade internal cooling passages and composite aerospace structures.

Frequently Asked Questions

What is the primary difference between the standard XRD 1640 AL and the AL3 ES variant?

The AL3 ES (Extended Shielding) model incorporates built-in high-density lead backing shielding plates behind the active hydrogenated amorphous silicon panel and electronic readout cards. This shielding protects the scan drivers and preamplifier arrays from scattering damage, extending sensor life when deployed with high-energy MV radiation sources, radioisotopes, or linear accelerators.

What power supply units can drive the XRD 1640 AL3 ES?

The detector requires a dedicated triple-output low-ripple regulated power supply. The factory standard unit is the PerkinElmer XRD-EP Power Supply (P/N: 95510254), which delivers +5.5 VDC, +12.5 VDC, and -12.5 VDC through a heavy-duty, shielded multi-conductor DC cable. The XRD-LPX power supply (P/N: 95510255) can also be utilized for specific low-duty industrial configurations.

Can this flat-panel detector be operated in wet or open-deck conditions?

The native enclosure of the XRD 1640 series is built for industrial and clinical clean-bay installations. When deployed on open decks, ship hulls, or pipeline trenches, the unit must be enclosed in an IP65/IP66 weatherized carbon-fiber protective containment bag or sealed shooting frame to guard the housing and data cable terminations from saltwater ingress and spray.

How often do offset and gain calibrations need to be performed on this detector?

For high-precision radiographic inspection, perform a Dark Field offset acquisition at the start of every inspection shift, or whenever the ambient operational temperature swings by more than ±3°C. Full Flat Field gain calibration with an unobstructed beam should be carried out periodically or after modifying radiation beam energies (kV/filter sets).